High current 6 kV 4H-SiC PiN diodes for power module switching applications

被引:2
|
作者
Hull, Brett A.
Das, Mrinal K.
Richmond, James T.
Heath, Bradley
Sumakeris, Joseph J.
Geil, Bruce
Scozzie, Charles J.
机构
[1] Cree Inc, Durham, NC 27703 USA
[2] USA, Res Lab, Adelphi, MD 20783 USA
关键词
PiN diode; bipolar power device; V-F drift; reverse recovery;
D O I
10.4028/www.scientific.net/MSF.527-529.1355
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Forward voltage (V-F) drift, in which a 4H-SiC PiN diode suffers from an irreversible increase in VF under forward current flow, continues to inhibit commercialization of 4H-SiC PiN diodes. We present our latest efforts at fabricating high blocking voltage (6 kV), high current (up to 50 A) 4H-SiC PiN diodes with the best combination of reverse leakage current (I-R), forward voltage at rated current (V-F) and V-F drift yields. We have achieved greater than 60% total die yield on-wafer for 50 A diodes with a chip size greater than 0.7 cm(2). A comparison of the temperature dependent conduction and switching characteristics between a 50 A/6 kV 4H-SiC PiN diode and a commercially available 60 A/4.5 kV Si PiN diode is also presented.
引用
收藏
页码:1355 / 1358
页数:4
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