A Finite Element Analysis on the Reliability of Heavy Bonding Wire for High-Power IGBT Module

被引:11
|
作者
Huang, Qiang [1 ,2 ]
Peng, Cheng [1 ,2 ]
Ellen, Serwaa Frimpong-Manso [1 ,2 ]
Zhu, Wenhui [1 ,2 ]
Wang, Liancheng [1 ,2 ]
机构
[1] Cent South Univ, State Key Lab High Performance Complex Mfg, Changsha 410083, Peoples R China
[2] Cent South Univ, Sch Mech & Elect Engn, Changsha 410083, Peoples R China
关键词
Wires; Bonding; Insulated gate bipolar transistors; Aluminum; Stress; Strain; Reliability; Bonding wire; ribbon; finite element analysis (FEA); IGBT module; polymer coating; reliability;
D O I
10.1109/TCPMT.2020.3028386
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Several methods that could effectively increase the strength of heavy aluminum bonding wire and broaden the scope for high-power IGBT module applications with a high degree of integration have been proposed. In this work, a series of finite element analysis has been carried out to study the thermomechanical reliability of bonding wire/ribbon under different conditions. The effects of structural loop parameters, bonding wire materials, bonding ribbon, and polymer coating are discussed based on simulation results, and the primary cause for the effect of geometric parameters has been developed. It is worth noticing that the reliability of the heavy bonding wires increases with the increase in Young's modulus and Poisson's rate in a polymer coating. This present study provides new insights into the thermomechanical behaviors of heavy bonding wire/ribbon, as well as a practical guide for designing an optimal structural loop shape and selecting an appropriate material of bonding wires or polymer, which will accelerate functional applications in industries.
引用
收藏
页码:212 / 221
页数:10
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