Atomic scale simulations of ductile failure micromechanisms in nanocrystalline Cu at high strain rates

被引:71
|
作者
Dongare, Avinash M. [1 ,2 ]
Rajendran, Arunachalam M. [3 ]
LaMattina, Bruce [4 ]
Zikry, Mohammed A. [2 ]
Brenner, Donald W. [1 ]
机构
[1] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA
[2] N Carolina State Univ, Dept Mech & Aerosp Engn, Raleigh, NC 27695 USA
[3] Univ Mississippi, Dept Mech Engn, University, MS 38677 USA
[4] USA, Res Off, Res Triangle Pk, NC 27709 USA
来源
PHYSICAL REVIEW B | 2009年 / 80卷 / 10期
基金
美国国家科学基金会;
关键词
VOID GROWTH; MECHANICAL-BEHAVIOR; MOLECULAR-DYNAMICS; SPALL STRENGTH; FCC METALS; FRACTURE; COPPER; NUCLEATION; SOLIDS; MODEL;
D O I
10.1103/PhysRevB.80.104108
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The micromechanisms related to ductile failure during dynamic loading of nanocrystalline Cu are investigated in a series of large-scale molecular-dynamics (MD) simulations. Void nucleation, growth, and coalescence are studied for a nanocrystalline Cu system with an average grain size of 6 nm under conditions of uniaxial tensile strain and triaxial tensile strain at a strain rate of 10(8) s(-1). The MD simulations of deformation of the nanocrystalline system under conditions of triaxial tensile stress show random nucleation of voids at grain boundaries and/or triple point junctions. The initial shape of the voids is nonspherical due to growth of the voids along the grain boundaries. Void growth is observed to occur by the creation of a shell of disordered atoms around the voids and not by nucleation of dislocations from the void surface. Void coalescence occurs by the shearing of the disordered regions in between the voids. The nucleation and growth of voids result in the relaxation of tensile stresses, after which growth of the voids is slower. The slower growth is accompanied by recrystallization of the surrounding disordered regions resulting in near-spherical shapes of the voids.
引用
收藏
页数:11
相关论文
共 50 条
  • [31] Modelling of the flow stress and description of ductile failure in a wide range of strain rates
    Abdel-Malek, S.
    Meyer, L. W.
    [J]. MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK, 2007, 38 (02) : 101 - 107
  • [32] Atomic-scale modeling of the void nucleation, growth, and coalescence in Al at high strain rates
    Yang, Xin
    Zeng, Xiangguo
    Wang, Jian
    Wang, Jiabin
    Wang, Fang
    Ding, Jun
    [J]. MECHANICS OF MATERIALS, 2019, 135 : 98 - 113
  • [33] Superplastic nanocrystalline ceramics at room temperature and high strain rates
    Zhang, J. Y.
    Sha, Z. D.
    Branicio, P. S.
    Zhang, Y. W.
    Sorkin, V.
    Pei, Q. X.
    Srolovitz, D. J.
    [J]. SCRIPTA MATERIALIA, 2013, 69 (07) : 525 - 528
  • [34] Growth of co nanostructures on Cu(110): Atomic-scale simulations
    Stepanyuk, Oleg V.
    Negulyaev, Nikolay N.
    Saletsky, Alexander M.
    Hergert, Wolfram
    [J]. PHYSICAL REVIEW B, 2008, 78 (11)
  • [35] Large-scale molecular dynamics simulations of three-dimensional ductile failure
    Zhou, SJ
    Beazley, DM
    Lomdahl, PS
    Holian, BL
    [J]. PHYSICAL REVIEW LETTERS, 1997, 78 (03) : 479 - 482
  • [37] INVESTIGATION OF LASER SHOCK INDUCED DUCTILE DAMAGE AT ULTRA-HIGH STRAIN RATE BY USING LARGE SCALE MD SIMULATIONS
    Cuq-Lelandais, J. -P.
    Boustie, M.
    Soulard, L.
    Berthe, L.
    Bontaz-Carion, J.
    de Resseguier, T.
    [J]. SHOCK COMPRESSION OF CONDENSED MATTER - 2011, PTS 1 AND 2, 2012, 1426
  • [38] Flow and failure behaviour of materials at high strain rates
    El-Magd, E.
    [J]. DYMAT 2009: 9TH INTERNATIONAL CONFERENCE ON THE MECHANICAL AND PHYSICAL BEHAVIOUR OF MATERIALS UNDER DYNAMIC LOADING, VOL 2, 2009, : 1303 - 1309
  • [39] Modeling deformation and failure of elastomers at high strain rates
    Aranda-Iglesias, D.
    Vadillo, G.
    Rodriguez-Martinez, J. A.
    Volokh, K. Y.
    [J]. MECHANICS OF MATERIALS, 2017, 104 : 85 - 92
  • [40] Material failure modelling in metals at high strain rates
    Panov, Vili
    Vignjevic, Rade
    Bourne, Neil
    Millet, Jerremy
    [J]. Shock Compression of Condensed Matter - 2005, Pts 1 and 2, 2006, 845 : 646 - 649