Group-delay ripple reduction in step-chirped fiber Bragg gratings by using laser-beam written step-chirped phase masks

被引：8
|
作者：
Komukai, T [1 ]
Inui, T
Kurihara, M
Fujimoto, S
机构：
[1] NTT Corp, NTT Network Innovat Labs, Kanagawa 2390847, Japan
[2] Dai Nippon Printing Co Ltd, Semicond Components Lab, Saitama 3568507, Japan
来源：
IEEE PHOTONICS TECHNOLOGY LETTERS | 2002年 / 14卷 / 11期
关键词：
chirped fiber Bragg grating (FBG); electron-beam; group-delay ripple; laser-beam; phase error; phase mask; stitching error;
D O I：
10.1109/LPT.2002.803367
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Step-chirped phase masks for step-chirped fiber Bragg gratings (FBGs) were fabricated by employing a new writing strategy, in which the beam is able to scan a step-chirped pattern all at once or continuously. This new writing strategy was realized by using a raster scan-type laser-beam writing system. Linearly and nonlinearly step-chirped FBGs, fabricated by using these masks, show very low group-delay ripple characteristics, which means that the masks have fewer stitching errors than conventional step-chirped masks.
引用
收藏
页码：1554 / 1556
页数：3
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