Single-event transients in voltage regulators

被引：20

作者：

Johnston, A. H. ^{[1
]}

Miyahira, T. F. ^{[1
]}

Irom, F. ^{[1
]}

Laird, J. S. ^{[1
]}

机构：

[1] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2006年 / 53卷 / 06期

关键词：

radiation testing; single-event transient; voltage regulator;

D O I：

10.1109/TNS.2006.886215

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Single-event transients are investigated for two voltage regulator circuits that are widely used in, space. A circuit-level model is developed that can be used to determine how transients are affected by different circuit application conditions. Internal protection circuits-which are affected by load as well as internal thermal effects-can also be triggered from heavy ions, causing dropouts or shutdown ranging from milliseconds to seconds. Although conventional output transients can be reduced by adding load capacitance, that approach is ineffective for dropouts from protection circuitry.

引用

页码：3455 / 3461

页数：7

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