A functional fault model with implicit fault effect propagation requirements

被引:0
|
作者
Pomeranz, Irith [1 ]
Patil, Srinivas [2 ]
Parvathala, Praveen K. [3 ]
机构
[1] Purdue Univ, Sch ECE, W Lafayette, IN 47907 USA
[2] Intel Corp, Test Technol, Austin, TX USA
[3] Intel Corp, Test Technol, Chandler, AZ USA
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
We define a functional fault model that does not include explicit fault effect propagation requirements. Test generation for this functional fault model is done considering only a fault free circuit. This simplifies the functional test generation process. We demonstrate through experimental results that functional test sequences generated based on this model are effective in providing very high gate-level stuck-at fault coverage.
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页码:95 / +
页数:2
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