Dephasing of Bloch oscillating electrons in GaAs-based superlattices due to interface roughness scattering

被引:27
|
作者
Unuma, T. [1 ]
Sekine, N. [1 ]
Hirakawa, K. [1 ]
机构
[1] Univ Tokyo, Inst Ind Sci, Meguro Ku, Tokyo 1538505, Japan
基金
日本科学技术振兴机构; 日本学术振兴会;
关键词
D O I
10.1063/1.2360911
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated dephasing mechanisms of Bloch oscillating electrons in GaAs- based superlattices (SLs) by time-domain terahertz electro-optic sampling method. It was found that dephasing time tau(r) for GaAs/AlAs SLs in the Wannier-Stark regime rapidly becomes shorter with decreasing well width L-w as tau(r) proportional to L-w(3-5). The observed strong Lw dependence of tau(r) indicates that the dominant dephasing mechanism is interface roughness scattering, which was indeed confirmed by quantitative comparison between theory and experiment. It was also found that alloy disorder scattering is negligibly weak even in the case of GaAs/ Al0.3Ga0.7As SLs. (c) 2006 American Institute of Physics.
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页数:3
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