Direct observation of variations of optical properties in single quantum dots by using time-resolved near-field scanning optical microscope

被引：4
|
作者：
Matsuda, K
Matsumoto, T
Saito, H
Nishi, K
Saiki, T
机构：
[1] Kanagawa Acad Sci & Technol, Kawasaki, Kanagawa 2130012, Japan
[2] Tokyo Inst Technol, Interdisciplinary Grad Sch Sci & Engn, Yokohama, Kanagawa 2268502, Japan
[3] NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
来源：
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES | 2000年 / 7卷 / 3-4期
关键词：
near-field scanning optical microscope; quantum dot; photoluminescence;
D O I：
10.1016/S1386-9477(99)00345-8
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
We study the variations of optical properties of self-assembled In0.5Ga0.5As single quantum dots (QDs) in the spatial and time domains by combining a near-field scanning optical microscope with an ultrafast pulsed laser. Through the examinations of several tens of QDs, we find that the variations of photoluminescence (PL) intensity strongly depend on the condition of the initial carrier creation. The differences in quantum efficiency and those in the carrier flow rate into QDs cause the large distribution of PL intensity when the carriers are excited in the barrier layers. From the results of time-resolved PL decay measurements, we find that there are two types of QDs exhibiting quite different PL decay profiles. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：377 / 382
页数：6
相关论文
共 50 条
  • [41] Shape and size variations during nanopatterning of photoresist using near-field scanning optical microscope
    Kwon, S
    Chang, W
    Jeong, S
    ULTRAMICROSCOPY, 2005, 105 (1-4) : 316 - 323
  • [42] Enhancement and quenching of the fluorescence of single CdSe/ZnS quantum dots studied by confocal apertureless near-field scanning optical microscope
    Protasenko, V
    Gallagher, A
    Labardi, M
    Nesbitt, DJ
    ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES, 2003, 5188 : 254 - 263
  • [43] Near-field optics imaging in silica waveguide using near-field scanning optical microscope
    Chau, Yuan-Fong
    Tsai, Din Ping
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (01): : 238 - 242
  • [44] Nanolocal time-resolved optical study using scanning probe microscope
    Lozovik, YE
    Klyuchnik, AV
    Merkulova, SP
    LASER SPECTROSCOPY AND OPTICAL DIAGNOSTICS: NOVEL TRENDS AND APPLICATIONS IN LASER CHEMISTRY, BIOPHYSICS, AND BIOMEDICINE - ICONO'98, 1999, 3732 : 93 - 100
  • [45] A simple scanning head for scanning near-field optical microscope
    Kazantsev, DV
    ULTRAMICROSCOPY, 1998, 71 (1-4) : 191 - 198
  • [46] Near-field optics imaging in silica waveguide using near-field scanning optical microscope
    Chau, Yuan-Fong
    Tsai, Din Ping
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2007, 46 (01): : 238 - 242
  • [47] Steady-state and time-resolved near-field optical spectroscopy of GaN/AlN quantum dots and InGaN/GaN quantum wells
    Kudrna, J
    Gucciardi, PG
    Vinattieri, A
    Colocci, M
    Damilano, B
    Semond, F
    Grandjean, N
    Massies, J
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 2002, 190 (01): : 155 - 160
  • [48] Ultra high density optical recording using a scanning near-field optical microscope
    Lu, YY
    Tsai, DP
    Guo, WR
    Chen, SC
    Liu, JR
    Shieh, HPD
    MINIATURIZED SYSTEMS WITH MICRO-OPTICS AND MICROMECHANICS III, 1998, 3276 : 244 - 248
  • [49] Direct measurement of evanescent wave interference with a scanning near-field optical microscope
    Hong, T
    Wang, J
    Xu, TJ
    Sun, LQ
    CHINESE PHYSICS LETTERS, 2004, 21 (05) : 907 - 910
  • [50] Direct photocurrent mapping of organic solar cells using a near-field scanning optical microscope
    McNeill, CR
    Frohne, H
    Holdsworth, JL
    Furst, JE
    King, BV
    Dastoor, PC
    NANO LETTERS, 2004, 4 (02) : 219 - 223
12345