Modeling and Experimental Test of Effective Dielectric Constant of Multilayer Substrate with Periodic Metal Inclusion

被引：0

作者：

Zhao, Teng ^{[1
]}

Song, Jiming ^{[1
]}

Kamgaing, Telesphor ^{[2
]}

机构：

[1] Iowa State Univ, Dept Elect & Comp Engn, Ames, IA 50011 USA

[2] Intel Corp, Components Res, Chandler, AZ 85226 USA

来源：

2013 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST (IMS) | 2013年

关键词：

dielectric measurement; integral equation; periodic structure; INTEGRAL-EQUATION ANALYSIS;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper applies a novel integral equation approach to model the multilayer substrate with periodic metal inclusion. The approach combines the equivalence principle with connection scheme to avoid the sophisticated multilayered periodic Green's function. Effective media theory is adopted to extract the effective dielectric constant. Good agreement has been achieved between our approach and analytical result. A printed circuit board was designed, fabricated and tested to validate our model.

引用

页数：3

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