Small protrusion used as a probe for apertureless scanning near-field optical microscopy

被引：0
|
作者：
Yamamoto, N [1 ]
Hiraga, T [1 ]
机构：
[1] Natl AIST, Photon Res Inst, R&D Grp Applicat Device, Ikeda 5638577, Japan
来源：
IEICE TRANSACTIONS ON ELECTRONICS | 2002年 / E85C卷 / 12期
关键词：
small protrusion probe; flat surface; near-field optics; SiO2; sphere; polystyrene sphere;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We demonstrated apertureless scanning near-field optical microscopy using a small protrusion (a simple 500-nm-diameter polystyrene particle) on a flat glass substrate as a probe. We designed a small sample stage to operate with the particle probe. It is a 40-mum-diameter circular stage, fabricated from an optical fiber by Hydrofluoric acid (HF) etching. In this paper, we present the first atomic force microscope and scanning near-field optical microscope images obtained with such a probe. We also discuss schemes for probe-sample distance control in this novel form of apertureless scanning near-field optical microscopy.
引用
收藏
页码：2104 / 2108
页数：5
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