Single key recovery attacks on reduced AES-192 and Kalyna-128/256

被引：6
|
作者：
Wang, Gaoli [1 ,2 ]
Zhu, Chunbo [1 ]
机构：
[1] Donghua Univ, Sch Comp Sci & Technol, Shanghai 201620, Peoples R China
[2] East China Normal Univ, Sch Comp Sci & Software Engn, Shanghai 200062, Peoples R China
来源：
SCIENCE CHINA-INFORMATION SCIENCES | 2017年 / 60卷 / 09期
基金：
中国国家自然科学基金;
关键词：
D O I：
10.1007/s11432-016-0417-7
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页数：3
相关论文
共 50 条
  • [21] 改进的10轮Kalyna-128/256中间相遇攻击
    刘亚
    占婷婷
    姒宏明
    李玮
    刘志强
    计算机应用研究, 2020, 37 (07) : 2112 - 2116+2122
  • [22] Related-key impossible differential attacks on 8-round AES-192
    Biham, E
    Dunkelman, O
    Keller, N
    TOPICS IN CRYPTOLOGY - CT-RSA 2006, PROCEEDINGS, 2006, 3860 : 21 - 33
  • [23] New Results in Related Key Impossible Differential Cryptanalysis on Reduced Round AES-192
    Jithendra, K. B.
    Shahana, T. K.
    2018 INTERNATIONAL CONFERENCE ON ADVANCES IN COMMUNICATION AND COMPUTING TECHNOLOGY (ICACCT), 2018, : 291 - 295
  • [24] Related-key square attack on AES-192
    Chen, J., 1600, Univ. of Electronic Science and Technology of China (42):
  • [25] 可兼容AES-128、AES-192、AES-256串行AES加密解密电路设计
    韩少男
    李晓江
    微电子学与计算机, 2010, 27 (11) : 40 - 45+50
  • [26] Improved Key Recovery Attacks on Reduced-Round AES in the Single-Key Setting
    Derbez, Patrick
    Fouque, Pierre-Alain
    Jean, Jeremy
    ADVANCES IN CRYPTOLOGY - EUROCRYPT 2013, 2013, 7881 : 371 - 387
  • [27] 简化AES-192和AES-256的相关密钥矩形新攻击
    韦永壮
    胡予濮
    中国科学（F辑:信息科学）, 2009, 39 (02) : 246 - 253
  • [28] A New Result of Impossible Differential Attacks on 7-Round AES-192
    Liu Jingmei
    Zhao Linsen
    Wang Xinmei
    CHINA COMMUNICATIONS, 2009, 6 (3A) : 111 - 115
  • [29] Improved Meet-in-the-Middle Attacks on Nine Rounds of the AES-192 Block Cipher
    Lu, Jiqiang
    Zhou, Wenchang
    TOPICS IN CRYPTOLOGY, CT-RSA 2024, 2024, 14643 : 136 - 159
  • [30] AES crypto-processor design supporting 128/192/256 bits input key length for smart card
    Lee, YK
    Lee, SW
    Kim, YS
    ESA'04 & VLSI'04, PROCEEDINGS, 2004, : 558 - 563
12345