Reduced instrumentation and optimized fault injection control for dependability analysis

Fault-injection based dependability analysis has proved to be an efficient mean to predict the behavior of a circuit in presence of faults. Instrumentation-based techniques are in general used to perform the injection during simulation or emulation. The weak point of these techniques remains the characteristics obtained after modification of either the high-level description or the circuit netlist, especially when emulation is used. This paper proposes an instrumentation technique reducing the extra hardware and accelerating the fault injection campaigns thanks to optimized fault location addressing and parallel injection.