Improved measurement of low residual stresses by speckle correlation interferometry and local heat treating

被引：0
|
作者：
Pechersky, MJ [1 ]
Estochen, EG [1 ]
Vikram, CS [1 ]
机构：
[1] Savannah River Technol Ctr, Aiken, SC 29808 USA
来源：
PROCEEDINGS OF THE SEM IX INTERNATIONAL CONGRESS ON EXPERIMENTAL MECHANICS | 2000年
关键词：
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
引用
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页码：800 / 803
页数：4
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