Plant cell wall characterization using scanning probe microscopy techniques

被引:39
|
作者
Yarbrough, John M. [1 ]
Himmel, Michael E. [1 ]
Ding, Shi-You [1 ]
机构
[1] Natl Renewable Energy Lab, Chem & Biosci Ctr, Golden, CO USA
关键词
FIELD FLUORESCENCE MICROSCOPY; ATOMIC-FORCE MICROSCOPY; OPTICAL MICROSCOPY; APERTURE PROBES; ARTIFACTS; LIGNOCELLULOSE; VISUALIZATION; MOLECULES;
D O I
10.1186/1754-6834-2-17
中图分类号
Q81 [生物工程学(生物技术)]; Q93 [微生物学];
学科分类号
071005 ; 0836 ; 090102 ; 100705 ;
摘要
Lignocellulosic biomass is today considered a promising renewable resource for bioenergy production. A combined chemical and biological process is currently under consideration for the conversion of polysaccharides from plant cell wall materials, mainly cellulose and hemicelluloses, to simple sugars that can be fermented to biofuels. Native plant cellulose forms nanometer-scale microfibrils that are embedded in a polymeric network of hemicelluloses, pectins, and lignins; this explains, in part, the recalcitrance of biomass to deconstruction. The chemical and structural characteristics of these plant cell wall constituents remain largely unknown today. Scanning probe microscopy techniques, particularly atomic force microscopy and its application in characterizing plant cell wall structure, are reviewed here. We also further discuss future developments based on scanning probe microscopy techniques that combine linear and nonlinear optical techniques to characterize plant cell wall nanometer-scale structures, specifically apertureless near-field scanning optical microscopy and coherent anti-Stokes Raman scattering microscopy.
引用
收藏
页码:1 / 11
页数:11
相关论文
共 50 条
  • [21] Advanced image characterization in scanning probe microscopy
    Rodrigues, CA
    Pinto, SCD
    Costa, LD
    Faria, RM
    de Souza, NC
    Oliveira, ON
    Bechtold, IH
    Oliveira, EA
    Bonvent, JJ
    XIV BRAZILIAN SYMPOSIUM ON COMPUTER GRAPHICS AND IMAGE PROCESSING, PROCEEDINGS, 2001, : 393 - 393
  • [22] Characterization of pharmaceutical solids by scanning probe microscopy
    Liao, XM
    Wiedmann, TS
    JOURNAL OF PHARMACEUTICAL SCIENCES, 2004, 93 (09) : 2250 - 2258
  • [23] New FM detection techniques for scanning probe microscopy
    Kobayashi, D., 1600, Japan Society of Applied Physics (43):
  • [24] Nanoscale characterization of semiconductor materials and devices using scanning probe techniques
    Univ of California at San Diego, La Jolla, United States
    Mater Sci Eng R Rep, 4-5 (147-206):
  • [25] Nanoscale characterization of semiconductor materials and devices using scanning probe techniques
    Yu, ET
    MATERIALS SCIENCE & ENGINEERING R-REPORTS, 1996, 17 (4-5): : 147 - 206
  • [26] Characterization of CVD-synthesized graphene films transferred on different substrates using the scanning probe microscopy electrical techniques
    Korkh, Yu. V.
    Rinkevich, A. B.
    Klepikova, A. S.
    Tolmacheva, E. A.
    Pankrushina, E. A.
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2022, 138
  • [27] Probe microscopy - Scanning below the cell surface
    Sahin, Ozgur
    NATURE NANOTECHNOLOGY, 2008, 3 (08) : 461 - 462
  • [28] Developments in application of light and scanning electron microscopy techniques for cell wall degradation studies
    Engels, FM
    NETHERLANDS JOURNAL OF AGRICULTURAL SCIENCE, 1996, 44 (04): : 357 - 373
  • [29] Electrical Scanning Probe Microscopy Techniques for the Detailed Characterization of high-k Dielectric Layers
    Rommel, M.
    Yanev, V.
    Paskaleva, A.
    Erlbacher, T.
    Lemberger, M.
    Bauer, A. J.
    Frey, L.
    DIELECTRICS FOR NANOSYSTEMS 4: MATERIALS SCIENCE, PROCESSING, RELIABILITY, AND MANUFACTURING, 2010, 28 (02): : 139 - +
  • [30] Surface characterization of InP trenches embedded in oxide using scanning probe microscopy
    Mannarino, Manuel
    Chintala, Ravi
    Moussa, Alain
    Merckling, Clement
    Eyben, Pierre
    Paredis, Kristof
    Vandervorst, Wilfried
    JOURNAL OF APPLIED PHYSICS, 2015, 118 (22)