This paper presents investigations on the electrical transport phenomena in sandwich type inorganic/single (double) organic layer/inorganic such as silicon; ITO/TPyP, Alq3, alpha-NPD; ZnPc; perylene" PTCDA/silicon and inorganic (metal)/organic/metal such as silicon (A/)/ZnPc; alpha-NPD; TPyP/copper, Al, structures, prepared by vacuum evaporation. For most of these heterostructures the IN characteristics in the static regime have a near ohmic behaviour only at low voltages (<1 V) that changes in a power dependence with a coefficient n=2 or n=3 at higher voltages because of the space charge or trapped charge phenomena. For the same applied voltage, the n type Si electrode injects more charge carriers in TpyP than in Alq3. For higher voltages (>10V) an increased number of charge carriers are injected from n type Si in Alq3 compared to TpyP. The injection properties of the interface ITO, Cu, Al electrode/organic layer have also been investigated. The best injection has been obtained through ITO/ZnPc interface. For a grid configuration of the Al electrodes the transport phenomena are determined by the resistivity of the structure.