Using a programmable interferometer for digital phase-shifting speckle interferometry

被引：0
|
作者：
Greco, V
Hoffer, L
Molesini, G
Trivi, M
机构：
[1] Istituto Nazionale di Ottica, I-Firenze 50125
[2] Centro de Investigaciones Opticas, CICPBA and Facultad de Ingenieria, Universidad de la Plata, La Plata
来源：
OPTICS AND LASERS IN ENGINEERING | 1997年 / 27卷 / 02期
关键词：
D O I：
10.1016/S0143-8166(96)00123-6
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The use of a programmable phase-shifting interferometer to detect the deformation of scattering surfaces is described. The interferometer is a commercial instrument in use for optical resting applications; the sample surface is imaged as a speckle pattern. The measuring procedure and the program are outlined, and an experimental demonstration on an aluminium plate under load is given. (C) 1997 Elsevier Science Ltd.
引用
收藏
页码：235 / 240
页数：6
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