Fabrication and properties of well-ordered arrays of single-crystalline NiSi2 nanowires and epitaxial NiSi2/Si heterostructures

被引:11
|
作者
Chuang, Chenfu [1 ]
Cheng, Shaoliang [1 ]
机构
[1] Cent Univ, Dept Chem & Mat Engn, Taoyuan 32001, Taiwan
关键词
nanosphere lithography; Si nanowire; NiSi2; nanowire; field emission; wettability; FIELD-EMISSION; SILICIDE NANOWIRES; DEPOSITION; SURFACES; GROWTH;
D O I
10.1007/s12274-014-0519-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this study, we reported the design, fabrication, and characterization of wellordered arrays of vertically-aligned, epitaxial NiSi2/Si heterostructures and single-crystalline NiSi2 nanowires on (001)Si substrates. The epitaxial NiSi2 with facets was found to be the first and the only silicide phase formed inside the Si nanowires after annealing at a temperature as low as 300 A degrees C. Upon annealing at 500 A degrees C for 4 h, the residual parts of Si nanowires were completely consumed and the NiSi2/Si heterostructured nanowires were transformed to fully silicided NiSi2 nanowires. XRD, TEM and SAED analyses indicated that all the NiSi2 nanowires were single crystalline and their axial orientations were parallel to the [001] direction. The obtained vertically-aligned NiSi2 nanowires, owing to their well-ordered arrangement, single-crystalline structure, and low effective work function, exhibit excellent field-emission properties with a very low turn-on field of 1.1 V/m. The surface wettability of the nanowires was found to switch from hydrophobic to hydrophilic after the formation of NiSi2 phase and the measured water contact angle decreased with increasing extent of Ni silicidation. The increased hydrophilicity can be explained by the Wenzel model. The obtained results present the exciting prospect that the new approach proposed here will provide the capability to fabricate other highly-ordered, vertically-aligned fully silicided nanowire arrays and may offer potential applications in constructing vertical silicide-based nanodevices.
引用
收藏
页码:1592 / 1603
页数:12
相关论文
共 50 条
  • [31] SINGLE-CRYSTAL SI/NISI2/SI(100) STRUCTURES
    TUNG, RT
    EAGLESHAM, DJ
    SCHREY, F
    SULLIVAN, JP
    JOURNAL OF APPLIED PHYSICS, 1993, 73 (12) : 8250 - 8257
  • [32] Self-assembled epitaxial NiSi2 nanowires on Si(001) by reactive deposition epitaxy
    Chen, SY
    Chen, LJ
    THIN SOLID FILMS, 2006, 508 (1-2) : 222 - 225
  • [33] Influence of Ga on the growth of NiSi2 on Si
    Mogilatenko, A.
    Allenstein, F.
    Schubert, M. A.
    Falke, M.
    Beddies, G.
    Hinneberg, H-J
    Neumann, W.
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 12 2008, 2008, 5 (12): : 3752 - +
  • [34] FORMATION AND STRUCTURE OF EPITAXIAL NISI2 AND COSI2
    CHEN, LJ
    MAYER, JW
    TU, KN
    THIN SOLID FILMS, 1982, 93 (1-2) : 135 - 141
  • [35] STUDY OF EPITAXIAL NISI2 ON SILICON BY TRANSMISSION CHANNELING
    CHEUNG, N
    NICOLET, MA
    MAYER, JW
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (08) : C344 - C344
  • [36] SCHOTTKY-BARRIER INHOMOGENEITY AT EPITAXIAL NISI2 INTERFACES ON SI(100)
    TUNG, RT
    LEVI, AFJ
    SULLIVAN, JP
    SCHREY, F
    PHYSICAL REVIEW LETTERS, 1991, 66 (01) : 72 - 75
  • [37] A study of the NiSi to NiSi2 transition in the Ni-Si binary system
    Julies, BA
    Knoesen, D
    Pretorius, R
    Adams, D
    THIN SOLID FILMS, 1999, 347 (1-2) : 201 - 207
  • [38] On Si/NiSi2/Si(111) Heterostructures Obtained by Solid-Phase Deposition
    Mustafoeva, N. M.
    Tashatov, A. K.
    Umirzakov, B. E.
    Mamatova, M. B.
    JOURNAL OF SURFACE INVESTIGATION, 2024, 18 (06): : 1415 - 1418
  • [39] Influence of C incorporation on the initial growth of epitaxial NiSi2 on Si(100)
    Okada, E
    Nakatsuka, O
    Oida, S
    Sakai, A
    Zaima, S
    Yasuda, Y
    APPLIED SURFACE SCIENCE, 2004, 237 (1-4) : 150 - 155
  • [40] EXPERIMENTAL-OBSERVATIONS ON EPITAXIAL NISI2 ISLANDS ON [111] ORIENTED SI
    HACKNEY, SA
    LYNCH, R
    SCRIPTA METALLURGICA ET MATERIALIA, 1990, 24 (04): : 681 - 686