Designs for diallel crosses for test versus control comparisons

被引:0
|
作者
Choi, KC [1 ]
Gupta, S
Kageyama, S
机构
[1] Chosun Univ, Dept Comp Sci & Stat, Kwangju 501759, South Korea
[2] No Illinois Univ, Div Stat, De Kalb, IL 60115 USA
[3] Hiroshima Univ, Dept Math, Higashihiroshima 7398524, Japan
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中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
Diallel crosses for comparing a control line with test lines are studied under the models for completely randomized designs and for block designs. Completely randomized designs that estimate control versus test comparisons with a minimum variance are listed within a practical range of parameters. Type S designs with nested blocks are introduced and some series of type S block designs for diallel crosses are provided. The efficiencies of these type S block designs for up to 25 lines are also tabulated.
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页码:167 / 180
页数:14
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