Organization of a Fully Self-Checking Structure of a Combinational Device Based on Searching for Groups of Symmetrically Independent Outputs

被引：0

作者：

Efanov, D. V. ^{[1
]}

Sapozhnikov, V. V. ^{[2
]}

Sapozhnikov, Vl. V. ^{[2
]}

机构：

[1] Russian Univ Transport, Moscow 127994, Russia

[2] Emperor Alexander I St Petersburg State Transport, St Petersburg 190031, Russia

来源：

AUTOMATIC CONTROL AND COMPUTER SCIENCES | 2020年 / 54卷 / 04期

关键词：

combinational device; fully self-checking structure; unidirectional error; symmetrical error; asymmetrical errors; asymmetrical and unidirectional error detection code; groups of symmetrically independent outputs; CONCURRENT ERROR-DETECTION; DETECTION CODES; DESIGN; CIRCUITS;

D O I：

10.3103/S0146411620040045

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

A new technique is elaborated for building combinational devices with fully self-checking structures, where any kind of single stuck-at faults in internal logical elements is detected. The suggested technique is based on searching for groups of combinational device outputs in which symmetrical errors are impossible (SI groups). When establishing such groups, the developer can choose the implementation options for a self-checking device, each of which assumes the use of a code for failure control with the detection of any unidirectional and asymmetrical errors (identified multiplicities included).

引用

页码：279 / 290

页数：12