Organization of a Fully Self-Checking Structure of a Combinational Device Based on Searching for Groups of Symmetrically Independent Outputs

A new technique is elaborated for building combinational devices with fully self-checking structures, where any kind of single stuck-at faults in internal logical elements is detected. The suggested technique is based on searching for groups of combinational device outputs in which symmetrical errors are impossible (SI groups). When establishing such groups, the developer can choose the implementation options for a self-checking device, each of which assumes the use of a code for failure control with the detection of any unidirectional and asymmetrical errors (identified multiplicities included).