Empirical mode decomposition for infrared thermography

被引：0
|
作者：
Tian, yu-peng [1 ]
Zhou, ke-yin
Ji-Juan
Yu, Sheng-Lin
机构：
[1] Nanjing Univ Aeronaut & Astronaut, Dept Measuring & Testing Technol, Nanjing 210016, Peoples R China
[2] Nanjing Univ Aeronaut & Astronaut, Dept Struct Engn & Mech, Nanjing 210016, Peoples R China
来源：
INSIGHT | 2006年 / 48卷 / 08期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
In this paper, an empirical mode decomposition (EMD) method is applied to image processing in pulsed infrared thermographic testing. Through analysis of the Mode Function of an image EMD, characterisations of noise and uneven heating are given. Using the EMD method, noise and uneven heating are reduced at the same time and the contrast of the thermal image is improved. Finally, the result of pulsed infrared thermographic testing is given. Compared with other methods such as neighbourhood averaging, homomorphic filtering and background subtraction, this method is simple and effective to overcome noise and uneven heating in thermography.
引用
收藏
页码：477 / 480
页数：4
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