Texture determination of ferroelectrics from in situ X-ray diffraction.

被引：0
|
作者：
Hinterstein, Manuel [1 ]
Knapp, Michael [2 ]
Fuess, Hartmut [3 ]
Ehrenberg, Helmut [2 ]
机构：
[1] IFW Dresden, Complex Mat, D-01069 Dresden, Germany
[2] CELLS, Barcelona 08193, Spain
[3] Tech Univ Darmstadt, Mat Sci, Darmstadt, Germany
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2010年 / 66卷
关键词：
ferroelectrics; X-ray diffraction; texture analysis;
D O I：
10.1107/S0108767310095516
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
FA2-MS17-P
引用
收藏
页码：S197 / S198
页数：2
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