We present a calibration method which allows single shot dual wavelength online shape measurement in a disturbed environment. Effects of uncontrolled carrier frequency filtering are discussed as well. We demonstrate that phase maps and speckle displacements can be recovered free of chromatic aberrations. To our knowledge, this is the first time that a single shot dual wavelength calibration is reported by defining a criteria to make the spatial filtering automatic avoiding the problems of manual methods. The procedure is shown to give shape accuracy of 35 mu m with negligible systematic errors using a synthetic wavelength of 1.1mm.
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Chonbuk Natl Univ, Div Mech Syst Engn, Jeonju 561756, South Korea
Natl Inst Stand, Engn & Surface Metrol Lab, El Haram, El Giza, EgyptChonbuk Natl Univ, Div Mech Syst Engn, Jeonju 561756, South Korea
Abdelsalam, D. G.
Magnusson, Robert
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Univ Texas Arlington, Dept Elect Engn, Arlington, TX 76019 USAChonbuk Natl Univ, Div Mech Syst Engn, Jeonju 561756, South Korea
Magnusson, Robert
Kim, Daesuk
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Chonbuk Natl Univ, Div Mech Syst Engn, Jeonju 561756, South KoreaChonbuk Natl Univ, Div Mech Syst Engn, Jeonju 561756, South Korea