Electronic counterfeit detection based on the measurement of electromagnetic fingerprint

Counterfeit integrated circuits become a big challenge for the whole electronic industry. The use of electronic, counterfeits can cause reduced performance of circuits, or failure of the whole system. New efficient approaches of counterfeit device detection are always required. Since the electromagnetic emission level of integrated devices depends on various circuit parameters like technology, manufacturing and aging, the electromagnetic emission measurement could be an approach to detect the counterfeit. In this article, the principles of the methodology are explained and two case studies are presented, where three ways of analysis of data are discussed. (C) 2015 Elsevier Ltd. All rights reserved.