The surface morphology, structural properties and chemical composition of Cd1-xZnxTe polycrystalline thick films deposited by close spaced vacuum sublimation

被引：11
|
作者：
Znamenshchykov, Y. V. [1 ]
Kosyak, V. V. [1 ]
Opanasyuk, A. S. [1 ]
Dauksta, E. [3 ]
Ponomarov, A. A. [2 ]
Romanenko, A. V. [2 ]
Stanislavov, A. S. [2 ]
Medvids, A. [3 ]
Shpetnyi, I. O. [1 ,4 ,5 ]
Gorobets, Yu. I. [4 ,5 ]
机构：
[1] Sumy State Univ, 2 Rymsky Korsakov Str, UA-40007 Sumy, Ukraine
[2] Natl Acad Sci Ukraine, Inst Appl Phys, 58 Petropavlivska Str, UA-40030 Sumy, Ukraine
[3] Riga Tech Univ, 3 Paula Valdena Str, LV-1048 Riga, Latvia
[4] Natl Acad Sci Ukraine, Inst Magnetism, 36-B Vernadsky Ave, UA-03142 Kiev, Ukraine
[5] Minist Educ & Sci Ukraine, 36-B Vernadsky Ave, UA-03142 Kiev, Ukraine
来源：
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING | 2017年 / 63卷
关键词：
Semiconducting ternary compounds; X-ray diffraction; Crystal structure; Polycrystalline deposition; Solid solutions; CDZNTE; GROWTH; CDTE; PHOTOLUMINESCENCE; PIXE; SPECTROSCOPY; DEPENDENCE; ENERGY; ZINC; TE;
D O I：
10.1016/j.mssp.2017.02.004
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Thick polycrystalline Cdi,ZnxTe films with x ranged from 0.37 to 0.80 were obtained by the close spaced vacuum sublimation method. In order to investigate properties of the films structural, PIXE and Raman studies were carried out. Determination of chemical composition of the films by EDS, PIXE and XRD has shown good correlation of results. Raman spectroscopy reveals the relation between zinc concentration and vibrational properties of the films. Studies of the spatial distribution of the chemical elements on the film surface by microPIXE and micro-Raman spectroscopy have shown that films are uniform and free of secondary phases such as CdTe, ZnTe and Te inclusions.
引用
收藏
页码：64 / 71
页数：8
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