Composition dependence of structural and optical properties of Cd1-xZnxTe thick films obtained by the close-spaced sublimation

被引:19
|
作者
Kosyak, V. [1 ,2 ]
Znamenshchykov, Y. [1 ]
Cerskus, A. [3 ]
Gnatenko, Yu P. [4 ]
Grase, L. [2 ]
Vecstaudza, J. [2 ]
Medvids, A. [2 ]
Opanasyuk, A. [1 ]
Mezinskis, G. [2 ]
机构
[1] Sumy State Univ, Rymskogo Korsakova Str 2, UA-40007 Sumy, Ukraine
[2] Riga Tech Univ, 3 Paula Valdena Str, LV-1048 Riga, Latvia
[3] Ctr Phys Sci & Technol, A Gostauto Str 11, LT-01108 Vilnius, Lithuania
[4] Natl Acad Sci Ukraine, Inst Phys, UA-03028 Kiev, Ukraine
关键词
Crystal structure; Semiconducting ternary compounds; Lattice defects; X-ray diffraction; Photoluminescence; Raman spectroscopy; RESONANT RAMAN-SCATTERING; VI-SEMICONDUCTOR ALLOYS; PHOTOLUMINESCENCE PROPERTIES; LOCALIZED EXCITONS; CDZNTE FILMS; CDTE; IMPURITY; ENERGY; GROWTH; BAND;
D O I
10.1016/j.jallcom.2016.05.065
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This paper reports the results of structural, photoluminescence and Raman characterization of thick Cd1-xZnxTe films with different zinc concentration obtained by the close spaced vacuum sublimation method. The analysis of the X-rays patterns allows us to determine the effect of the zinc concentration on crystal quality of the films. It was found that samples with x approximate to 0.10 and x approximate to 0.32 have high crystal quality. However, with increasing of zinc concentration the crystal quality decreases. This result was confirmed by the photoluminescence study. Namely, the significant degradation of optical properties for the samples with high zinc concentration (x > 0.32) was observed. Raman spectroscopy reveals the relation between zinc concentration and vibrational properties of the films. Also, the micro-Raman method shows that obtained films are uniform and free of tellurium inclusions. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:543 / 551
页数:9
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