Activator ionization and deep level ionization in SrS:Ce ac thin-film electroluminescent devices

被引：4

作者：

Peter, M ^{[1
]}

Nishimura, S ^{[1
]}

Murayama, M ^{[1
]}

Ohmi, K ^{[1
]}

Tanaka, S ^{[1
]}

Kobayashi, H ^{[1
]}

机构：

[1] Tottori Univ, Dept Elect & Elect Engn, Tottori 6808552, Japan

来源：

JOURNAL OF APPLIED PHYSICS | 1999年 / 86卷 / 12期

关键词：

D O I：

10.1063/1.371794

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

This report focuses on the ionization mechanism of dynamic space charge formation during ac thin-film electroluminescent device operation. Laser excitation under operating condition is used to identify the ionization mechanism. It is concluded, that Ce3+ ionization and ionization of other deep levels are forming the dynamic space charge. The charge emission process is impact excitation in combination with tunnel emission. The Ce3+ excited state is more than 0.23 eV below the conduction band and the ground state of other deep levels is more than 3.6 eV below the conduction band. (C) 1999 American Institute of Physics. [S0021-8979(99)07124-8].

引用

页码：7071 / 7078

页数：8

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