Tomographic image alignment in three-dimensional coherent diffraction microscopy

被引：14

作者：

Chen, Chien-Chun ^{[1
]}

Miao, Jianwei ^{[2
,3
]}

Lee, T. K. ^{[1
]}

机构：

[1] Acad Sinica, Inst Phys, Taipei 11529, Taiwan

[2] Univ Calif Los Angeles, Dept Phys & Astron, Los Angeles, CA 90095 USA

[3] Univ Calif Los Angeles, Calif NanoSyst Inst, Los Angeles, CA 90095 USA

来源：

PHYSICAL REVIEW B | 2009年 / 79卷 / 05期

关键词：

correlation methods; gallium compounds; image registration; nanoparticles; semiconductor quantum dots; tomography; X-ray diffraction; X-ray microscopy; X-RAY CRYSTALLOGRAPHY; ALLOW;

D O I：

10.1103/PhysRevB.79.052102

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report the development of a tomographic image alignment method, based on the moment of charge density, for three-dimensional (3D) coherent diffraction microscopy. By using a 3D model system, we demonstrate that the moment of charge density improves the alignment accuracy over the conventional cross-correlation method. Better results are also obtained when we apply this method to the alignment of 27 experimental projections from a GaN-Ga2O3 quantum dot nanoparticle.

引用

页数：4

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