A new method for assessment of spurious trip in safety instrumented system

被引：0
|
作者：
Ding, Zhenyu [1 ]
Bao, Shiyi [1 ]
Gao, Zengliang [1 ]
机构：
[1] Zhejiang Univ Technol, Coll Mech Engn, Hangzhou 310032, Zhejiang, Peoples R China
来源：
STRUCTURAL INTEGRITY AND MATERIALS AGEING IN EXTREME CONDITIONS | 2010年
关键词：
Spurious Trip; SIL; MTTFS; PFS;
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
Spurious trip plays an important contribution to downtime-caused economic loss and restoration-caused hazards in process industry. In order to assess the performance of safety instrumented system more objectively, a new spurious trip model based on Markov model is proposed and the relationship between MTTFS (Mean Time to Fail Safe) and PFS (Probability of Fail Safe) is obtained in this paper. Method for calculation of MTTFS is put forward and the feasibility and the correctness of the algorithm are verified. At last, a new assessment index to spurious trip is proposed and introduced.
引用
收藏
页码：393 / 397
页数：5
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