Critical current density of thin YBCO films on buffered sapphire substrates

被引：23
|
作者：
Komashko, VA
Popov, AG
Svetchnikov, VL
Pronin, AV
Melnikov, VS
Galkin, AY
Pan, VM
Snead, CL
Suenaga, M
机构：
[1] Natl Acad Sci Ukraine, Inst Met Phys, UA-252142 Kiev, Ukraine
[2] Brookhaven Natl Lab, Upton, NY 11973 USA
来源：
SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 2000年 / 13卷 / 02期
关键词：
D O I：
10.1088/0953-2048/13/2/316
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The critical current density of YBa2Cu3O7-delta films de magnetron sputtered onto buffered (CeO2) sapphire substrates is measured. The peculiarities of these dependences are interpreted by taking into account the crystal defect (edge dislocations) film structure which in turn is determined by the film growth mode.
引用
收藏
页码：209 / 214
页数：6
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