Structural and optical characterizations of porous anodic alumina-aluminum nanocomposite films on borofloat substrates
被引:3
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作者:
Arslan, Hande Cavus
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TUBITAK Marmara Res Ctr, Mat Inst, TR-41470 Gebze, Kocaeli, Turkey
Istanbul Univ, Dept Met & Mat Engn, TR-34320 Istanbul, TurkeyTUBITAK Marmara Res Ctr, Mat Inst, TR-41470 Gebze, Kocaeli, Turkey
Arslan, Hande Cavus
[1
,2
]
Yusufoglu, Ibrahim
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Istanbul Univ, Dept Met & Mat Engn, TR-34320 Istanbul, TurkeyTUBITAK Marmara Res Ctr, Mat Inst, TR-41470 Gebze, Kocaeli, Turkey
Yusufoglu, Ibrahim
[2
]
Aslan, Mustafa M.
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TUBITAK Marmara Res Ctr, Mat Inst, TR-41470 Gebze, Kocaeli, TurkeyTUBITAK Marmara Res Ctr, Mat Inst, TR-41470 Gebze, Kocaeli, Turkey
Aslan, Mustafa M.
[1
]
机构:
[1] TUBITAK Marmara Res Ctr, Mat Inst, TR-41470 Gebze, Kocaeli, Turkey
[2] Istanbul Univ, Dept Met & Mat Engn, TR-34320 Istanbul, Turkey
Structural and optical properties of the porous anodic alumina (PAA)-aluminum (Al) nanocomposite and the PAA-nanostructured films on borofloat substrates are studied. The films are fabricated by the anodization of 170- to 200- and 295- to 330-nm-thick Al sputtered onto the borofloat. The anodization process is stopped at different times in order to form the PAA-Al nanocomposite films with different layer thicknesses. Then, the pore widening is applied to 189- to 210- and 430- to 495-nm-thick PAA films in 5- and 10-min intervals, respectively. The structural properties of the films are characterized by a scanning electron microscopy. The nanocomposite films are also characterized optically by total reflection and directional transmission measurements in the wavelength range between 250 and 800 nm. Our results indicate that controlling the thicknesses of both Al and the PAA layers by anodization time and the morphology of the nanostructures by chemical etching duration in the PAA layer provides unique PAA-Al nanocomposite films with desired optical properties. (C) 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
机构:
Hebei Normal Univ, Coll Phys Sci & Informat Engn, Shijiazhuang 050016, Peoples R China
Key Lab Adv Films Hebei Prov, Shijiazhuang 050016, Peoples R ChinaHebei Normal Univ, Coll Phys Sci & Informat Engn, Shijiazhuang 050016, Peoples R China
Xu, Qin
Sun, Hui-Yuan
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Hebei Normal Univ, Coll Phys Sci & Informat Engn, Shijiazhuang 050016, Peoples R China
Key Lab Adv Films Hebei Prov, Shijiazhuang 050016, Peoples R ChinaHebei Normal Univ, Coll Phys Sci & Informat Engn, Shijiazhuang 050016, Peoples R China
Sun, Hui-Yuan
Yang, Yu-Hua
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机构:
Hebei Normal Univ, Coll Phys Sci & Informat Engn, Shijiazhuang 050016, Peoples R China
Key Lab Adv Films Hebei Prov, Shijiazhuang 050016, Peoples R ChinaHebei Normal Univ, Coll Phys Sci & Informat Engn, Shijiazhuang 050016, Peoples R China
Yang, Yu-Hua
Liu, Li-Hu
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机构:
Hebei Normal Univ, Coll Phys Sci & Informat Engn, Shijiazhuang 050016, Peoples R China
Key Lab Adv Films Hebei Prov, Shijiazhuang 050016, Peoples R ChinaHebei Normal Univ, Coll Phys Sci & Informat Engn, Shijiazhuang 050016, Peoples R China
Liu, Li-Hu
Li, Zi-Yue
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机构:
Hebei Normal Univ, Coll Phys Sci & Informat Engn, Shijiazhuang 050016, Peoples R China
Key Lab Adv Films Hebei Prov, Shijiazhuang 050016, Peoples R ChinaHebei Normal Univ, Coll Phys Sci & Informat Engn, Shijiazhuang 050016, Peoples R China