Temperature-dependent domain investigations on exchange-biased IrMn-NiFe and IrMn-CoFe systems

被引:7
|
作者
Seidel, R [1 ]
de Haas, O
Schaefer, R
Schultz, L
Ruehrig, M
Wecker, J
机构
[1] IFW Dresden, D-01069 Dresden, Germany
[2] Siemens AG, CT MM1, Innovat Elect, D-91052 Erlangen, Germany
关键词
exchange bias; Kerr microscopy; magnetic domains; magnetic films;
D O I
10.1109/TMAG.2002.803157
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The magnetic microstructure and magnetization processes of sputtered IrMn-NiFe exchange-biased films were studied by Kerr microscopy and magneto-optical magnetometry in a temperature range from room temperature to 200 degreesC. A ferromagnetic film in the exchange-biased state (as created by cooling a regular domain pattern or a saturated state from above the blocking temperature) is reversed in a patch-like way in applied magnetic fields, indicating inhomogeneities in the coupling. The domain processes are reversible far below the blocking temperature TB and get increasingly irreversible within a range of some 10 K around TB. Magnetic anisotropies in the ferromagnetic layer, though clearly visible above the blocking temperature, have no significant influence on exchange bias. A granular frozen-in domain pattern is observed in as-deposited bilayers, indicating the presence of local exchange bias even without annealing.
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页码:2776 / 2778
页数:3
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