Thermal interface materials: Historical perspective, status, and future directions

被引:710
|
作者
Prasher, Ravi [1 ]
机构
[1] Intel Corp, Chandler, AZ 85226 USA
[2] Arizona State Univ, Dept Mech & Aerosp Engn, Tempe, AZ 85287 USA
关键词
bond line thickness (BLT); nanoparticles; nano-tube; polymer rheology; thermal boundary resistance; thermal interface material (TIM);
D O I
10.1109/JPROC.2006.879796
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
I with the continual increase in cooling demand for microprocessors, there has been an increased focus within the microelectronics industry on developing thermal solutions. Thermal interface materials (TIMs) play a key role in thermally connecting various components of the thermal solution. Review of the progress made in the area of TIMs in the past five years is presented. The focus is on the rheology-based modeling and design of polymeric TIMs due to their widespread use. Review of limited literature on the thermal performance of solders is also provided. Merits and demerits of using nanoparticles and nanotubes for TIM applications are also discussed. I conclude the paper with some directions for the future that I feel are relatively untouched and potentially very beneficial.
引用
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页码:1571 / 1586
页数:16
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