Electrical and optical characterization of freestanding Ge1Sb2Te4 nano-membranes integrated in coplanar strip lines

被引:0
|
作者
Mikulics, M. [1 ,2 ]
Marso, M. [3 ]
Adam, R. [1 ,2 ]
Schuck, M. [1 ,2 ]
Fox, A. [1 ,2 ]
Sobolewski, R. [4 ,5 ]
Kordos, P. [6 ]
Lueth, H. [1 ,2 ]
Gruetzmacher, D. [1 ,2 ]
Hardtdegen, H. [1 ,2 ]
机构
[1] Forschungszentrum Julich, Peter Grunberg Inst, D-52425 Julich, Germany
[2] JARA Fundamentals Future Informat Technol, Julich, Germany
[3] Univ Luxembourg, Fac Sci Technol & Commun, L-I359 Luxembourg, Luxembourg
[4] Univ Rochester, Dept Elect & Comp Engn, 601 Elmwood Ave, Rochester, NY 14627 USA
[5] Univ Rochester, Laser Energet Lab, 250 E River Rd, Rochester, NY 14627 USA
[6] Slovak Tech Univ, Inst Elect & Photon, SK-81219 Bratislava, Slovakia
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We developed a transfer and integration technique for freestanding Ge1Sb2Te4 nano-membranes. A so-called laser micro annealing process for the precisely-local formation of low resistance Ge1Sb2Te4/Ti/Au ohmic contacts was optimized. Ultrafast switching effects were studied on nano membrane devices after their implementation into a group III-nitride based optoelectronic circuit. Highly resistive switching was observed without any noticeable structural deterioration. Charge transport measurements indicate that current densities exhibit values in the "READ resp. SET/RESET" regime from 10(-6) down to 10(-11)A/mu m(3) after similar to 100 switching cycles. Our study on freestanding Ge1Sb2Te4 nano-membranes contributes to a better understanding of charge transport related physical phenomena in novel chalcogenide material systems with high potential for future low energy consumption data storage devices.
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页码:73 / 76
页数:4
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