Radiation damage of Schottky CdTe detectors irradiated by 200 MeV protons

被引：27
|
作者：
Eisen, Y [1 ]
Evans, LG
Floyd, S
Schlemm, C
Starr, R
Trombka, J
机构：
[1] Soreq NRC, IL-81800 Yavne, Israel
[2] NASA, Goddard Space Flight Ctr, USRA, Greenbelt, MD 20771 USA
[3] Comp Sci Corp, Laurel, MD 20706 USA
[4] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA
[5] Johns Hopkins Univ, Appl Phys Lab, Laurel, MD 20723 USA
[6] Catholic Univ Amer, Dept Phys, Washington, DC 20064 USA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2002年 / 491卷 / 1-2期
关键词：
Schottky CdTe(Cl) X-ray detector; radiation damage;
D O I：
10.1016/S0168-9002(02)01229-9
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
This study describes the damage of a 2 mm x 2 mm x 1 mm Schottky CdTe detector after being irradiated by 200 MeV protons to a total fluence in the range 10(10)-10(11) p/cm(2). The investigation describes the change of spectroscopic characteristics caused by the irradiation as well as the change of the detector stability with time. A qualitative discussion is presented on the density of deep traps created by the irradiation. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：176 / 180
页数：5
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