Reliability of compound semiconductor devices for space applications

被引：8
|
作者：
Kayali, S [1 ]
机构：
[1] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
来源：
MICROELECTRONICS RELIABILITY | 1999年 / 39卷 / 12期
关键词：
D O I：
10.1016/S0026-2714(99)00180-8
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Application of semiconductor devices in high reliability space systems requires a thorough understanding of the reliability and failure mechanisms associated with the selected devices. This paper provides a description of the reliability and qualification issues related to the application of compound semiconductor devices in critical space systems. A discussion of common failure mechanisms, radiation effects and other reliability concerns is provided along with a discussion of methods for technology qualification for high reliability space applications. (C) 1999 Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：1723 / 1736
页数：14
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