Depth resolution of piezoresponse force microscopy

被引：37

作者：

Johann, Florian ^{[1
]}

Ying, Yongjun J. ^{[2
]}

Jungk, Tobias ^{[1
]}

Hoffmann, Akos ^{[1
]}

Sones, Collin L. ^{[2
]}

Eason, Robert W. ^{[2
]}

Mailis, Sakellaris ^{[2
]}

Soergel, Elisabeth ^{[1
]}

机构：

[1] Univ Bonn, Inst Phys, D-53115 Bonn, Germany

[2] Univ Southampton, Optoelect Res Ctr, Southampton SO17 1BJ, Hants, England

来源：

APPLIED PHYSICS LETTERS | 2009年 / 94卷 / 17期

关键词：

electric domains; lithium compounds; piezoelectric materials; piezoelectricity; SINGLE-CRYSTALS;

D O I：

10.1063/1.3126490

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Given that a ferroelectric domain is generally a three dimensional entity, the determination of its area as well as its depth is mandatory for full characterization. Piezoresponse force microscopy (PFM) is known for its ability to map the lateral dimensions of ferroelectric domains with high accuracy. However, no depth profile information has been readily available so far. Here, we have used ferroelectric domains of known depth profile to determine the dependence of the PFM response on the depth of the domain, and thus effectively the depth resolution of PFM detection.

引用

页数：3

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