Vertical strain-induced dot size uniformity and thermal stability of InAs/GaAsN/GaAs coupled quantum dots

被引:4
|
作者
Biswas, Mahitosh [1 ]
Singh, Sandeep [1 ]
Balgarkashi, Akshay [1 ]
Makkar, Roshan [2 ]
Bhatnagar, Anuj [2 ]
Sreedhara, Sheshadri [3 ]
Chakrabarti, Subhananda [1 ]
机构
[1] Indian Inst Technol, Dept Elect Engn, Bombay 400076, Maharashtra, India
[2] Soc Appl Microwave Engn Elect & Res, Photon Div, IIT Powai Campus, Bombay 400076, Maharashtra, India
[3] Indian Inst Technol, Dept Mech Engn, Bombay 400076, Maharashtra, India
关键词
GaAsN; Coupled quantum dots; Dot size uniformity; Deep level defects; Local vibrational mode; Strain coupling; Thermal stability; NITROGEN BACKGROUND PRESSURE; GAAS;
D O I
10.1016/j.jallcom.2018.03.163
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We report, for the first time, 10-layer InAs/GaAsN/GaAs quantum dots (QDs) by varying the GaAs layer thickness and investigate their optical properties. Due to propagation of strain field from bottom to top, multiple stacking of self-assembled QDs helps special ordering of QDs on surface resulting in dot size uniformity. InAs coupled QDs with GaAsN/GaAs spacers of 2/10 nm exhibited a bimodal distribution with narrow linewidths and low As-related deep level defect peak intensity, attributable to good optical quality of QDs. N-like local vibrational mode in Raman spectroscopy was found to be consisted of ten oscillation fringes, possibly because of ten periods of GaAsN layer used in QD-heterostructures. Higher strain coupling resulted in lesser blue-shift with increasing annealing temperature as compared to the lower coupling, leading to thermal stability of coupled QDs. Coupled QDs exhibiting narrow linewidths and thermal stability could be employed in fabrication of photodetectors. (C) 2018 Elsevier B.V. All rights reserved.
引用
收藏
页码:601 / 607
页数:7
相关论文
共 50 条
  • [21] Strain-induced quantum ring hole states in a gated vertical quantum dot
    Liu, J
    Zaslavsky, A
    Freund, LB
    PHYSICAL REVIEW LETTERS, 2002, 89 (09) : 968041 - 968044
  • [22] Spectroscopic signature of strain-induced quantum dots created by buried InAs quantum dots in an InGaAs quantum well
    Mazur, Yu. I.
    Dorogan, V. G.
    Marega, E., Jr.
    Tarasov, G. G.
    Salamo, G. J.
    JOURNAL OF APPLIED PHYSICS, 2011, 110 (05)
  • [23] Thermal induced carrier's transfer in bimodal size distribution InAs/GaAs quantum dots
    Ilahi, B.
    Alshehri, K.
    Madhar, N. A.
    Sfaxi, L.
    Maaref, H.
    RESULTS IN PHYSICS, 2018, 9 : 904 - 905
  • [24] Strain-induced interfacial hole localization in self-assembled quantum dots: Compressive InAs/GaAs versus tensile InAs/InSb
    He, LX
    Bester, G
    Zunger, A
    PHYSICAL REVIEW B, 2004, 70 (23) : 1 - 9
  • [25] Two color blinking of single strain-induced GaAs quantum dots
    Bertram, D
    Hanna, MC
    Nozik, AJ
    APPLIED PHYSICS LETTERS, 1999, 74 (18) : 2666 - 2668
  • [26] Capping InAs quantum dots with an InGaAsSb strain-reducing layer to improve optical properties and dot-size uniformity
    Liu, Wei-Sheng
    Chang, Ching-Min
    THIN SOLID FILMS, 2014, 570 : 490 - 495
  • [27] Effects of GaAs-spacer strain on vertical ordering of stacked InAs quantum dots in a GaAs matrix
    Rouvimov, S
    Liliental-Weber, Z
    Swider, W
    Washburn, J
    Weber, ER
    Sasaki, A
    Wakahara, A
    Furkawa, Y
    Abe, T
    Noda, S
    JOURNAL OF ELECTRONIC MATERIALS, 1998, 27 (05) : 427 - 432
  • [28] Effects of GaAs-spacer strain on vertical ordering of stacked InAs quantum dots in a GaAs matrix
    S. Rouvimov
    Z. Liliental-Weber
    W. Swider
    J. Washburn
    E. R. Weber
    A. Sasaki
    A. Wakahara
    Y. Furkawa
    T. Abe
    S. Noda
    Journal of Electronic Materials, 1998, 27 : 427 - 432
  • [29] The role of stressor size fluctuation in photoluminescence of strain-induced quantum dots
    Ahopelto, J
    Sopanen, M
    Lipsanen, H
    Tulkki, J
    COMPOUND SEMICONDUCTORS 1998, 1999, (162): : 421 - 426
  • [30] Three-dimensional strain field calculations in coupled InAs/GaAs quantum dots
    Jogai, B
    JOURNAL OF APPLIED PHYSICS, 2000, 88 (09) : 5050 - 5055