LACBED study of extended defects in 4H-SiC

被引:10
|
作者
Texier, M. [1 ]
Regula, G. [1 ]
Lancin, M. [1 ]
Pichaud, B. [1 ]
机构
[1] Univ Aix Marseille 3, CNRS, UMR 6122, Lab TECSEN, F-13397 Marseille 20, France
关键词
D O I
10.1080/09500830600873752
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Large-angle convergent-beam electron diffraction analysis was successfully performed on pairs of partial dislocations so close that their effect on Bragg lines overlap. These pairs, dragging 3C layers, were nucleated by mechanical deformation of 4H-SiC. Splitting of Bragg lines on crossing a dislocation pair can be interpreted as resulting from a single dislocation having a Burgers vector (B) over right arrow equal to the sum of the two partial dislocation ones. Splitting rules using phase-shifted reflections ((g) over right arrow g . (b) over right arrow not equal n, with n is an element of Z) are also given depending on the phase shift produced by 3C lamellae. These results give a (b) over right arrow b direction in agreement with weak-beam dark-field studies and suggest that Si core dislocations have highest mobilities for low-temperature (<700 degrees C) plastic deformation.
引用
收藏
页码:529 / 537
页数:9
相关论文
共 50 条
  • [31] DFT Simulation of Stacking Faults Defects in 4H-SiC
    Wozny, Janusz
    Kovalchuk, Andrii
    Lisik, Zbigniew
    Podgorski, Jacek
    Bugalski, Piotr
    Kubiak, Andrzej
    Ruta, Lukasz
    2018 XIVTH INTERNATIONAL CONFERENCE ON PERSPECTIVE TECHNOLOGIES AND METHODS IN MEMS DESIGN (MEMSTECH), 2018, : 65 - 68
  • [32] Understanding the microstructures of triangular defects in 4H-SiC homoepitaxial
    Guo, Jianqiu
    Yang, Yu
    Raghothamachar, Balaji
    Kim, Taejin
    Dudley, Michael
    Kim, Jungyu
    JOURNAL OF CRYSTAL GROWTH, 2017, 480 : 119 - 125
  • [33] Effects of structural defects on diode properties in 4H-SiC
    Skromme, BJ
    Palle, KC
    Mikhov, MK
    Meidia, H
    Mahajan, S
    Huang, XR
    Vetter, WM
    Dudley, M
    Moore, K
    Smith, S
    Gehoski, T
    SILICON CARBIDE 2002-MATERIALS, PROCESSING AND DEVICES, 2003, 742 : 181 - 186
  • [34] Defects as qubits in 3C- and 4H-SiC
    Gordon, L.
    Janotti, A.
    Van de Walle, C. G.
    PHYSICAL REVIEW B, 2015, 92 (04)
  • [35] Defects in epitaxial 4H-SiC revealed by exciton recombination
    Migliore, Francesca
    Cannas, Marco
    Mario Gelardi, Franco
    Vecchio, Daniele
    Brischetto, Andrea
    Agnello, Simonpietro
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2024, 36 (18)
  • [36] Theory of shallow and deep boron defects in 4H-SiC
    Torres, Vitor J. B.
    Capan, Ivana
    Coutinho, Jose
    PHYSICAL REVIEW B, 2022, 106 (22)
  • [37] Electrical Conductivity Improvement of Point Defects in 4H-SiC
    Tan, Chih Shan
    CRYSTAL GROWTH & DESIGN, 2023, 23 (09) : 6250 - 6257
  • [38] Reduction of morphological defects in 4H-SiC epitaxial layers
    Li, Yun
    Zhao, Zhifei
    Yu, Le
    Wang, Yi
    Zhou, Ping
    Niu, Yingxi
    Li, Zhonghui
    Chen, Yunfeng
    Han, Ping
    JOURNAL OF CRYSTAL GROWTH, 2019, 506 : 108 - 113
  • [39] Defects in High Energy Ion Irradiated 4H-SiC
    Izzo, G.
    Litrico, G.
    Severino, A.
    Foti, G.
    La Via, F.
    Calcagno, L.
    SILICON CARBIDE AND RELATED MATERIALS 2008, 2009, 615-617 : 397 - 400
  • [40] Ion implantation induced defects in epitaxial 4H-SiC
    Hallén, A
    Henry, A
    Pellegrino, E
    Svensson, BG
    Åberg, D
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 61-2 : 378 - 381