Analogue and mixed-signal test for systems on chip

被引：3
|
作者：
Sun, YC [1 ]
机构：
[1] Univ Hertfordshire, Hatfield AL10 9AB, Herts, England
来源：
IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS | 2004年 / 151卷 / 04期
关键词：
D O I：
10.1049/ip-cds:20040924
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：335 / 336
页数：2
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