A Flowmeter with Piezoresistive Metal Layer Deposited with Focused-Ion-Beam System

被引:1
|
作者
Choi, Dae Keun [1 ]
Lee, Sang Hoon [1 ,2 ]
机构
[1] Seoul Natl Univ Sci & Technol, Grad Sch NID Fus Technol, Seoul 139743, South Korea
[2] Seoul Natl Univ Sci & Technol, Dept Mech & Automot Engn, Seoul 139743, South Korea
基金
新加坡国家研究基金会;
关键词
Flowmeter; focused-ion-beam system (FIB system); piezoresistive material; small area detection; MEMS; AIR-FLOW SENSOR; TEMPERATURE; FABRICATION; HUMIDITY; DESIGN;
D O I
10.1080/10584587.2014.912910
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we fabricated and evaluated a flowmeter with a sub-micron sized piezoresistive layer for the measurement in the small area. For the small area detection, the sensing material should be reduced as well as sensor body. We use the FIB system to reduce the size of the sensing material and obtain the sub-micron sized line width. The device is fabricated with the standard MEMS process, and the platinum layer is selected as the piezoresistive material considering the electrical conductivity. The 0 similar to 4m/s air flows are applied to the flowmeter and the experimental results shows the negative sensitivity output with -3.22E(-5)/ms(-1). This negative value is due to the additional materials like carbon and gallium. The various experiments including stability and repeatability are performed, and the repeated operation shows stable output signals with less than 9.6% variation. Through those experiment results, the FIB assisted platinum layer is suitable for the piezoresistive detection and a flowmeter can be applied to measurement of flow rate in the small area.
引用
收藏
页码:157 / 167
页数:11
相关论文
共 50 条
  • [31] Beam interactions in a focused ion beam system with a liquid metal ion source
    de Jager, P.W.H., 1600, Publ by Elsevier Science Publ Co Inc, New York, NY, United States (23): : 1 - 4
  • [32] SIMPLE CALCULATION ON TOPOGRAPHY OF FOCUSED-ION-BEAM SPUTTERED SURFACE
    ISHITANI, T
    OHNISHI, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1989, 28 (02): : L320 - L322
  • [33] Implanted gallium ion concentrations of focused-ion-beam prepared cross sections
    Ishitani, T
    Koike, H
    Yaguchi, T
    Kamino, T
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (04): : 1907 - 1913
  • [34] The focused-ion-beam microscope—More than a precision ion milling machine
    Jian Li
    JOM, 2006, 58 : 27 - 31
  • [35] The focused-ion-beam microscope - More than a precision ion milling machine
    Li, J
    JOM, 2006, 58 (03) : 27 - 31
  • [36] Minimizing damage during focused-ion-beam induced desorption of hydrogen
    Fuhrmann, H
    Candel, A
    Döbeli, M
    Mühle, R
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (06): : 2443 - 2446
  • [37] Enhanced collimation in narrow channels fabricated by focused-ion-beam implantation
    Bever, T.
    Hirayama, Y.
    Tarucha, S.
    Journal of Applied Physics, 1994, 75 (05):
  • [38] Formation of oriented nanocrystals in an amorphous alloy by focused-ion-beam irradiation
    Tarumi, R
    Takashima, K
    Higo, Y
    APPLIED PHYSICS LETTERS, 2002, 81 (24) : 4610 - 4612
  • [39] Patterning of Spiral Structure on Optical Fiber by Focused-Ion-Beam Etching
    Mekaru, Harutaka
    Yano, Takayuki
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2012, 51 (06)
  • [40] A study of fused silica micro/nano patterning by focused-ion-beam
    Li, Wuxia
    Lalev, Georgi
    Dimov, Stefan
    Zhao, Hao
    Pham, D. T.
    APPLIED SURFACE SCIENCE, 2007, 253 (07) : 3608 - 3614