Timing uncertainty measurements an the Power5 microprocessor

被引：25
|
作者：
Restle, PJ [1 ]
Franch, RL [1 ]
James, NK [1 ]
Huott, WV [1 ]
Skergan, TM [1 ]
Wilson, SC [1 ]
Schwartz, NS [1 ]
Clabes, JG [1 ]
机构：
[1] IBM Corp, Yorktown Hts, NY 10598 USA
来源：
2004 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE, DIGEST OF TECHNICAL PAPERS | 2004年 / 47卷
关键词：
D O I：
10.1109/ISSCC.2004.1332740
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：354 / 355
页数：2
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