The effect of photoemission on nanosecond helium microdischarges at atmospheric pressure

被引:33
|
作者
Donko, Zoltan [1 ,2 ]
Hamaguchi, Satoshi [2 ]
Gans, Timo [3 ]
机构
[1] Hungarian Acad Sci, Wigner Res Ctr Phys, Inst Solid State Phys & Opt, Konkoly Thege Miklos Str 29-33, H-1121 Budapest, Hungary
[2] Osaka Univ, Grad Sch Engn, Ctr Atom & Mol Technol, 2-1 Yamadaoka, Suita, Osaka 5650871, Japan
[3] Univ York, Dept Phys, York Plasma Inst, York, N Yorkshire, England
来源
PLASMA SOURCES SCIENCE & TECHNOLOGY | 2018年 / 27卷 / 05期
基金
英国工程与自然科学研究理事会;
关键词
microdischarge; PIC simulation; photoemission; PLASMA-ASSISTED IGNITION; DISCHARGE; BREAKDOWN; PHYSICS;
D O I
10.1088/1361-6595/aac301
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Atmospheric-pressure microdischarges excited by nanosecond high-voltage pulses are investigated in helium-nitrogen mixtures by first-principles particle-based simulations, which include VUV resonance radiation transport via the tracing of photon trajectories. The VUV photons, of which the frequency redistribution in the emission processes is included in some detail, are found to modify the computed discharge characteristics remarkably, due to their ability to induce electron emission from the cathode surface. Electrons created this way enhance the plasma density, and a significant increase of the transient current pulse amplitude is observed. The simulations allow the computation of the density of helium atoms in the 2(1)P resonant state, as well as the density of photons in the plasma and the line shape of the resonant VUV radiation reaching the electrodes. These indicate the presence of significant radiation trapping in the plasma and photon escape times longer than the duration of the excitation pulses are found.
引用
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页数:14
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