Finite size effects on the gate leakage current in graphene nanoribbon field-effect transistors

被引:15
|
作者
Mao, Ling-Feng [1 ]
机构
[1] Soochow Univ, Sch Elect & Informat Engn, Suzhou 215021, Peoples R China
基金
美国国家科学基金会; 中国国家自然科学基金;
关键词
D O I
10.1088/0957-4484/20/27/275203
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The finite size effects in nanoribbon graphene field-effect transistors (FETs) make the energy distribution of the channel electrons very different from that when neglecting finite size effects. Such an effect is especially obvious when the width of the graphene ribbon is a few nanometers. Thus, it results in more high-energy electrons in a nanoribbon graphene FET than in a two-dimensional graphene FET for the same device structure and parameters. Furthermore, such an energy distribution of channel electrons results in a change in the gate leakage current of a nanoribbon graphene FET. The numerical calculations demonstrate that the tunneling current rapidly increases with decreasing width of the graphene ribbon. This implies that a workable graphene FET after considering gate oxide reliability should have a channel width larger than 100 nm.
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页数:4
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