Single Photon Absorption Laser Facility for Single Event Effect Testing

被引：0

作者：

Newton, Michael ^{[1
]}

Danger, Brook ^{[2
]}

Chen, Li ^{[1
]}

Sammynaiken, Ramaswami ^{[2
]}

Wang, Haibin ^{[1
]}

Hiemstra, David M. ^{[3
]}

Kirischian, Valeri ^{[3
]}

机构：

[1] Univ Saskatchewan, Dept Elect & Comp Engn, Saskatoon, SK, Canada

[2] Univ Saskatchewan, Struct Sci Ctr, Saskatoon, SK, Canada

[3] MDA Corp, Brampton, ON, Canada

来源：

2016 IEEE CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING (CCECE) | 2016年

关键词：

Hall Effect; laser; single event effects; single photon absorption;

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

The laser testing facility for single event effects (SEEs) at the Saskatchewan Structural Sciences Centre, University of Saskatchewan is introduced and its principles of operation described. An ultrafast pulsed laser setup is used to investigate the SEE behavior of microelectronic circuits and devices. The capabilities of the system as they relate to SEE generation via single photon absorption are described. Single event transient (SET) data obtained for an Optek OMH3075 Hall effect sensor are provided. The Optek laser data is compared with heavy ion data previously collected.

引用

页数：5

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