Energy level alignment at the interfaces in a multilayer organic light-emitting diode structure

被引:64
|
作者
Olthof, S. [1 ]
Meerheim, R. [1 ]
Schober, M. [1 ]
Leo, K. [1 ]
机构
[1] Tech Univ Dresden, Inst Angew Photophys, D-01062 Dresden, Germany
来源
PHYSICAL REVIEW B | 2009年 / 79卷 / 24期
关键词
charge injection; energy states; iridium compounds; multilayers; organic compounds; organic light emitting diodes; phosphorescence; semiconductor materials; ultraviolet photoelectron spectra; X-ray photoelectron spectra; ELECTRONIC-STRUCTURE; FILMS; METALS; LAYERS;
D O I
10.1103/PhysRevB.79.245308
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We use photoelectron spectroscopy to study the electronic structure and energy level alignment throughout an organic light-emitting diode. The structure under investigation is a state-of-the-art long-living red phosphorescent device composed of doped charge-injection layers, charge-blocking layers, and an emission layer. By consecutively building up the whole device, the key parameters of every interface are measured. Our results show that the doped layers have a significant influence on the device energetics, especially in controlling the built-in potential, and that there are mostly only small dipoles present at the interfaces of the intrinsic organic layers.
引用
收藏
页数:7
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