Approximant-based orientation determination of quasicrystals using electron backscatter diffraction

被引：7

作者：

Cios, Grzegorz ^{[1
]}

Nolze, Gert ^{[2
,3
]}

Winkelmann, Aimo ^{[1
,7
]}

Tokarski, Tomasz ^{[1
]}

Hielscher, Ralf ^{[4
]}

Strzalka, Radoslaw ^{[5
]}

Buganski, Ireneusz ^{[5
]}

Wolny, Janusz ^{[5
]}

Bala, Piotr ^{[1
,6
]}

机构：

[1] AGH Univ Sci & Technol, Acad Ctr Mat & Nanotechnol, Al A Mickiewicza 30, PL-30059 Krakow, Poland

[2] BAM Fed Inst Mat Res & Testing, Unter Eichen 87, D-12205 Berlin, Germany

[3] TU Bergakad Freiberg, Inst Mineral, Brennhausgasse 14, D-09596 Freiberg, Germany

[4] Tech Univ Chemnitz, Dept Math, Reichenhainer Str 39, D-09126 Chemnitz, Germany

[5] AGH Univ Sci & Technol, Fac Phys & Appl Comp Sci, Al A Mickiewicza 30, PL-30059 Krakow, Poland

[6] AGH Univ Sci & Technol, Fac Met & Ind Comp Sci, Al A Mickiewicza 30, PL-30059 Krakow, Poland

[7] Univ Strathclyde, Dept Phys, SUPA, Glasgow G4 0NG, Lanark, Scotland

来源：

ULTRAMICROSCOPY | 2020年 / 218卷

关键词：

EBSD; Quasicrystal; Approximant; Crystal orientation; Data processing; PATTERN-MATCHING APPROACH; EBSD; PHASE; ALLOYS; SIMULATION; PRECISION; CAST;

D O I：

10.1016/j.ultramic.2020.113093

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Orientation mapping of quasicrystalline materials is demonstrated using crystalline approximant structures in the technique of electron backscatter diffraction (EBSD). The approximant-based orientations are symmetrised according to the rotational point group of the quasicrystal, including the visualization of orientation maps using proper colour keys for quasicrystal symmetries. Alternatively, approximant-based orientation data can also be treated using pseudosymmetry post-processing options in the EBSD system software, which enables basic grain size estimations. Approximant-based orientation analyses are demonstrated for icosahedral and decagonal quasicrystals.

引用

页数：10

共 50 条

[21] Orientation relationships of martensite variants determined by electron backscatter diffraction
Chen, XM
Gui, JN
Wang, RH
Wang, JB
Liu, J
Chen, FY
Wang, DH
MICRON, 2000, 31 (01) : 17 - 25
[22] Crystallographic Orientation of Cuttlebone Shield Determined by Electron Backscatter Diffraction
Maggie Cusack
Peter Chung
JOM, 2014, 66 : 139 - 142
[23] ON DETERMINATION OF CRYSTALLINE ORIENTATION BY ELECTRON DIFFRACTION
GRONLUND, F
ACTA CHEMICA SCANDINAVICA, 1964, 18 (09): : 2103 - &
[24] Pattern Center Determination in Electron Backscatter Diffraction Microscopy
Basinger, Jay
Fullwood, David
Kacher, Josh
Adams, Brent
MICROSCOPY AND MICROANALYSIS, 2011, 17 (03) : 330 - 340
[25] Restoration of Noisy Orientation Maps from Electron Backscatter Diffraction Imaging
Emmanuel Atindama
Peter Lef
Günay Doğan
Prashant Athavale
Integrating Materials and Manufacturing Innovation, 2023, 12 : 251 - 266
[26] Orientation Precision of Electron Backscatter Diffraction Measurements Near Grain Boundaries
Wright, Stuart I.
Nowell, Matthew M.
de Kloe, Rene
Chan, Lisa
MICROSCOPY AND MICROANALYSIS, 2014, 20 (03) : 852 - 863
[27] Restoration of Noisy Orientation Maps from Electron Backscatter Diffraction Imaging
Atindama, Emmanuel
Lef, Peter
Dogan, Guenay
Athavale, Prashant
INTEGRATING MATERIALS AND MANUFACTURING INNOVATION, 2023, 12 (03) : 251 - 266
[28] Crystallographic orientation of ilmenite inclusions in amphibole - an electron backscatter diffraction study
Xu, Chang
Zhao, Shanrong
Zhou, Jiaohua
He, Xu
Xu, Haijun
ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS, 2020, 235 (4-5): : 105 - 116
[29] Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy
Dingley, D
JOURNAL OF MICROSCOPY-OXFORD, 2004, 213 : 214 - 224
[30] Facet type determination based on combined atomic force microscopy and electron backscatter diffraction
Bruning, Ralf
Hajati, Mehrad
Lelievre, Peter G.
Bernhard, Tobias
Dieter, Sascha
Dietrich, Gregoire
JOURNAL OF MICROSCOPY, 2023, 290 (01) : 10 - 22

← 1 2 3 4 5 →