Photoluminescence study of C-H and C-D centers in 4H SiC

被引:0
|
作者
Bai, S [1 ]
Yan, F
Devaty, RP
Choyke, WJ
Grötzschel, R
Wagner, G
MacMillan, MF
机构
[1] Univ Pittsburgh, Dept Phys & Astron, Pittsburgh, PA 15260 USA
[2] Forschungszentrum Rossendorf EV, DE-01314 Dresden, Germany
[3] Inst Kristallzuchtung, Berlin, Germany
[4] Dow Corning Compund Semicond, Tampa, FL USA
关键词
hydrogen; deuterium; ion implantation; morse potential; optical quenching;
D O I
10.4028/www.scientific.net/MSF.457-460.589
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Eight p-type 4H SiC epitaxial films with p-type doping from 10(15)cm(-3) to 10(17)cm(-3) were implanted with deuterium at room temperature to a fluence of about 10(15) cm(-2). The bound exciton spectrum and the stretch modes of the C-D center are observed for four samples where the p-type doping is below 1.5x10(16) cm(-3) while no deuterium related spectra are seen for the four samples with higher doping levels. We were able to see two harmonic sidebands of the no-phonon lines and their energies are compared with those observed in 6H and 15R SiC. One unusual feature about the photoluminescence spectra of C-H or C-D centers in 4H SiC is the optical quenching effect. One of our deuterium implanted samples showed a strong hydrogen spectrum before implantation. We used this opportunity to compare the quenching effect of both C-H and C-D centers in the same sample.
引用
收藏
页码:589 / 592
页数:4
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