Interrelatedness of Fe composition on structural and magnetic properties in Fe-doped SrRuO3 thin films

被引：4

作者：

Yoo, Y. Z. ^{[1
]}

Chmaissem, O. ^{[1
]}

Kolesnik, S. ^{[1
]}

Brown, D. E. ^{[1
]}

Dabrowski, B. ^{[1
]}

Kimball, C. W. ^{[1
]}

Kim, T. -W. ^{[2
]}

Kim, M. -S. ^{[3
]}

Genis, A. P. ^{[4
]}

Song, J. -H. ^{[5
]}

机构：

[1] No Illinois Univ, Dept Phys, Inst NanoSci Engn & Technol INSET, De Kalb, IL 60115 USA

[2] Korea Inst Ind Technol, Appl Opt & Energy Res Grp, Kwangju 506824, South Korea

[3] TongMyong Univ, Dept Informat & Commun Engn, Pusan 608711, South Korea

[4] No Illinois Univ, Dept Elect Engn, Inst NanoSci Engn & Technol INSET, De Kalb, IL 60115 USA

[5] PaiChai Univ, Dept Informat & Elect Mat Engn, Taejon 302735, South Korea

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2014年 / 115卷 / 03期

关键词：

GROWTH;

D O I：

10.1007/s00339-013-7888-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Fe-doping (up to 11 mole%) into SrRuO3 (SRO) thin films on SrTiO3 substrates decreased correlation lengths of both surface and interface. It turned out that Fe was doped in the valence state of 3+ without formation of the Fe2O3 phase, which caused orthorhombic distortion. T (C) values decreased from 145 K to 97 K with increasing Fe concentration (C (Fe)). High magnetic switching fields were observed for all Fe-doped SRO thin films and their strengths showed a linear relationship with C (Fe). Detail structural characterization using synchrotron X-ray diffraction and X-ray photoemission spectroscopy were used to understand its unique magnetic switching field properties.

引用

页码：913 / 917

页数：5

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