Low-power scan driver embedded with level shifter using depletion-mode amorphous indium-gallium-zinc-oxide thin-film transistors for high-resolution flat-panel displays

被引:1
|
作者
Lee, Chang-Hee [1 ]
Kwon, Oh-Kyong [1 ]
机构
[1] Hanyang Univ, Dept Elect Engn, Seoul 133791, South Korea
关键词
SEMICONDUCTORS; SILICON; TFTS;
D O I
10.7567/JJAP.53.03CD01
中图分类号
O59 [应用物理学];
学科分类号
摘要
A low-power scan driver embedded with a level shifter using depletion-mode amorphous indium-gallium-zinc-oxide (a-IGZO) thin-film transistors (TFTs) is proposed for high-resolution flat-panel displays (FPDs). In order to achieve low power consumption, the scan driver uses clock signals with a reduced voltage swing. Furthermore, the level shifter is implemented without using a diode-connected TFT. This scan driver is simulated at an output voltage swing of 30V and an operating frequency (fop) of 153.6 kHz, which satisfy the driving conditions for 10-in. wide quadruple extended graphics array (WQXGA, 1600 X 2560) FPDs with a frame frequency of 60Hz. The simulation results of the proposed scan driver demonstrate the successful operation even at a threshold voltage shift (Delta V-th) of % -2.0V. The power consumption of the proposed scan driver per ten stages is 0.41mW, which is 80.75% less than that reported in a previous work. (C) 2014 The Japan Society of Applied Physics
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页数:6
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